Expiry date digits recognition using deep learning
Document Type
Conference Proceeding
Publication Date
2019
Department/School
Engineering Technology
Publication Title
Proceedings of the IEEE National Aerospace Electronics Conference, NAECON
Abstract
In this paper, a deep learning model is proposed to recognize expiry date digits from images. This model can be used with smart expiry architecture to get automatic notification in the smartphone for the foods that are expiring soon. The proposed model is tested and has an accuracy of 80%.
Link to Published Version
Recommended Citation
Khan, T. (2019). Expiry date digits recognition using deep learning. 2019 IEEE National Aerospace and Electronics Conference (NAECON) , 302–304. https://doi.org/10.1109/NAECON46414.2019.9058255