10.1109/NAECON46414.2019.9058255">
 

Expiry date digits recognition using deep learning

Document Type

Conference Proceeding

Publication Date

2019

Department/School

Engineering Technology

Publication Title

Proceedings of the IEEE National Aerospace Electronics Conference, NAECON

Abstract

In this paper, a deep learning model is proposed to recognize expiry date digits from images. This model can be used with smart expiry architecture to get automatic notification in the smartphone for the foods that are expiring soon. The proposed model is tested and has an accuracy of 80%.

Link to Published Version

10.1109/NAECON46414.2019.9058255

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